Logistic Test Effort Function Based Software Reliability Growth Model with Multi up Gradation

Ajay Kumar Gupta; Suneet Saxena; Nancy Achrya

Ajay Kumar Gupta Bhagwant Institute of Technology, Muzaffarnagar U.P., India
Suneet Saxena Department of Mathematics, SRMS College of Engineering and Technology, Bhojipura, Bareilly U.P, India
Nancy Achrya Bhagwant Universtiy, Ajmer

Keywords: NHPP, Software Reliability, Multi up-gradation, logistic TEF

Abstract

Paper presents the development of the software reliability growth model under multi-up gradation process. In up gradation process new version of the software is released in the market with some new features. The process is repeated and referred to as multi-up gradation. The model has been developed using logistic test effort function. logistic distribution described increasing/decreasing phenomenon fairly. Three generations of the model have been developed and compared using statistical tools R2 and MSE. Results validate good fitting of the third generation to a given dataset.